User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: Fluke 2625A:Hydra Data Logger DATE: 20-Aug-97 AUTHOR: User Contributed REVISION: 0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 31 NUMBER OF LINES: 247 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON # This procedure is based on the verification procedure in the User's Manual # dated March 1991, Rev 2. # The 90 day specifications of the 5700A are used in TUR computations. 1.001 ASK- R Q N P F W 1.002 ASK+ X 1.003 HEAD INITIAL CONDITIONS 1.004 DISP WARNING!!!!!!!!!!!!!!!!!!!! 1.004 DISP HIGH VOLTAGE is used or exposed during the performance 1.004 DISP of this calibration. DEATH ON CONTACT may result if 1.004 DISP personnel fail to observe safety precautions. 1.005 DISP Connect the UUT to an AC power source. 1.005 DISP Turn the UUT on. 1.005 DISP Warm-up time: 30 minutes. 1.005 DISP Ambient temperature: 18C - 28C. 1.005 DISP Relative humidity: less than 70%. 1.005 DISP 1.005 DISP Connect the UUT to COMM 1 of the PC with a NULL 1.005 DISP MODEM cable. 1.006 DISP To select the proper RS-232C parameters on Fluke Hydra: 1.006 DISP Press SHIFT, then LIST to select COMM. 1.006 DISP Use the [30] and [31] keys to make selections. 1.006 DISP Select 4800 baud and press ENTER. 1.006 DISP Select no Parity and press ENTER. 1.006 DISP Select OFF Echo and press ENTER. 1.007 HEAD Please Wait ...... Self Test running 1.008 PORT [P4800,N,8,1,X][T10000] 1.009 PORT [CLR]*TST?[10][D32000][I] 1.010 MATH MEM1 = MEM 1.011 JMPZ 1.014 1.012 HEAD SELF TEST FAILED: STATUS = [MEM] 1.013 JMP 31.004 1.014 HEAD 1.015 DISP To reduce noise pickup by test leads, particularly 1.015 DISP during high Ohms verification, use shielded test 1.015 DISP cables between the Fluke 5700A and Fluke Hydra. 1.016 DISP Make the following connections to the Input Module: 1.016 DISP 5700A TO HYDRA 1.016 DISP OUTPUT V OHM A HI ........... CH1 HI INPUT 1.016 DISP OUTPUT V OHM A LO ........... CH1 LO INPUT 1.016 DISP SENSE V OHM HI .............. CH11 HI INPUT 1.016 DISP SENSE V OHM LO .............. CH11 LO INPUT 1.017 HEAD {* DIRECT VOLTAGE TEST *} 1.018 JMP 2.001 1.019 EVAL 2.001 PORT FUNC 1,VDC,1;MON 1,1[10] 2.002 5700 0.00mV S 2W 2.003 PORT [CLR]MON_VAL?[10][I] 2.004 MATH MEM = MEM * 1000 2.005 MEME 2.006 MEMC 300 mV 0.02U #! Test Tol 2e-005, Sys Tol 7.5e-007, TUR 26.667 (>= 4.00). 3.001 5700 150.00mV S 2W 3.002 PORT [CLR]MON_VAL?[10][I] 3.003 MATH MEM = MEM * 1000 3.004 MEME 3.005 MEMC 100 mV 0.07U #! Test Tol 7e-005, Sys Tol 1.8e-006, TUR 38.889 (>= 4.00). 4.001 5700 290.00mV S 2W 4.002 PORT [CLR]MON_VAL?[10][I] 4.003 MATH MEM = MEM * 1000 4.004 MEME 4.005 MEMC 300 mV 0.11U #! Test Tol 0.00011, Sys Tol 2.94e-006, TUR 37.415 (>= 4.00). 5.001 PORT MON 0;FUNC 1,VDC,2;MON 1,1[10] 5.002 5700 2.9000V S 2W 5.003 PORT [CLR]MON_VAL?[10][I] 5.004 MEME 5.005 MEMC 3 V 0.0012U #! Test Tol 0.0012, Sys Tol 1.85e-005, TUR 64.865 (>= 4.00). 6.001 5700 -2.9000V S 2W 6.002 PORT [CLR]MON_VAL?[10][I] 6.003 MEME 6.004 MEMC 3 V 0.0012U #! Test Tol 0.0012, Sys Tol 1.85e-005, TUR 64.865 (>= 4.00). 7.001 PORT MON 0;FUNC 1,VDC,3;MON 1,1[10] 7.002 5700 29.000V S 2W 7.003 PORT [CLR]MON_VAL?[10][I] 7.004 MEME 7.005 MEMC 30 V 0.010U #! Test Tol 0.01, Sys Tol 0.000274, TUR 36.496 (>= 4.00). 8.001 PORT MON 0;FUNC 1,VDC,4;MON 1,1[10] 8.002 5700 150.00V S 2W 8.003 PORT [CLR]MON_VAL?[10][I] 8.004 MEME 8.005 MEMC 150 V 0.06U #! Test Tol 0.06, Sys Tol 0.001, TUR 60.000 (>= 4.00). 9.001 5700 290.00V S 2W 9.002 PORT [CLR]MON_VAL?[10][I] 9.003 MEME 9.004 MEMC 300 V 0.10U #! Test Tol 0.1, Sys Tol 0.00292, TUR 34.247 (>= 4.00). 10.001 PORT MON 0;FUNC 1,VDC,I100MV;MON 1,1[10] 10.002 5700 0.000mV S 2W 10.003 PORT [CLR]MON_VAL?[10][I] 10.004 MATH MEM = MEM * 1000 10.005 MEME 10.006 MEMC 100 mV 0.007U #! Test Tol 7e-006, Sys Tol 7.5e-007, TUR 9.333 (>= 4.00). 11.001 5700 90.000mV S 2W 11.002 PORT [CLR]MON_VAL?[10][I] 11.003 MATH MEM = MEM * 1000 11.004 MEME 11.005 MEMC 100 mV 0.380U #! Test Tol 0.00038, Sys Tol 1.38e-006, TUR 275.362 (>= 4.00). 12.001 PORT MON 0;FUNC 1,VDC,I1V;MON 1,1[10] 12.002 5700 900.00mV S 2W 12.003 PORT [CLR]MON_VAL?[10][I] 12.004 MATH MEM = MEM * 1000 12.005 MEME 12.006 MEMC 1000 mV 0.22U #! Test Tol 0.00022, Sys Tol 6.6e-006, TUR 33.333 (>= 4.00). 13.001 PORT MON 0[10] 13.002 5700 * S 13.003 HEAD {} 13.004 HEAD {* ALTERNATING VOLTAGE TEST *} 13.005 JMP 14.001 13.006 EVAL 14.001 PORT FUNC 1,VAC,1;MON 1,1[10] 14.002 5700 20.00mV 1kH O S 2W 14.003 PORT [CLR]MON_VAL?[10][I] 14.004 MATH MEM = MEM * 1000 14.005 MEME 14.006 MEMC 300 mV -0.29U +0.28U 1kH #! Test Tol 0.00028, Sys Tol 8.2e-006, TUR 34.146 (>= 4.00). 15.001 5700 20.00mV 100kH O S 2W 15.002 PORT [CLR]MON_VAL?[10][I] 15.003 MATH MEM = MEM * 1000 15.004 MEME 15.005 MEMC 300 mV 1.50U 100kH #! Test Tol 0.0015, Sys Tol 2.6e-005, TUR 57.692 (>= 4.00). 16.001 5700 290.00mV 1kH S 2W 16.002 PORT [CLR]MON_VAL?[10][I] 16.003 MATH MEM = MEM * 1000 16.004 MEME 16.005 MEMC 300 mV 0.74U 1kH #! Test Tol 0.00074, Sys Tol 2.875e-005, TUR 25.739 (>= 4.00). 17.001 5700 290.00mV 100kH S 2W 17.002 PORT [CLR]MON_VAL?[10][I] 17.003 MATH MEM = MEM * 1000 17.004 MEME 17.005 MEMC 300 mV 15.0U 100kH #! Test Tol 0.015, Sys Tol 0.0001525, TUR 98.361 (>= 4.00). 18.001 PORT MON 0;FUNC 1,VAC,2;MON 1,1[10] 18.002 5700 2.9000V 1kH S 2W 18.003 PORT [CLR]MON_VAL?[10][I] 18.004 MEME 18.005 MEMC 3 V 0.0066U 1kH #! Test Tol 0.0066, Sys Tol 0.0002875, TUR 22.957 (>= 4.00). 19.001 PORT MON 0;FUNC 1,VAC,3;MON 1,1[10] 19.002 5700 29.000V 1kH S 2W 19.003 PORT [CLR]MON_VAL?[10][I] 19.004 MEME 19.005 MEMC 30 V 0.069U 1kH #! Test Tol 0.069, Sys Tol 0.00332, TUR 20.783 (>= 4.00). 20.001 PORT MON 0;FUNC 1,VAC,4;MON 1,1[10] 20.002 5700 290.00V 1kH S 2W 20.003 PORT [CLR]MON_VAL?[10][I] 20.004 MEME 20.005 MEMC 300 V 0.66U 1kH #! Test Tol 0.66, Sys Tol 0.0272, TUR 24.265 (>= 4.00). 21.001 PORT MON 0[10] 21.002 5700 * S 21.003 RSLT = 21.004 HEAD {} 21.005 HEAD {* RESISTANCE TEST *} 21.006 JMP 22.001 21.007 EVAL 22.001 PORT FUNC 1,OHMS,1,4;MON 1,1[10] 22.002 5700 0.00Z S 4W 22.003 PORT [CLR]MON_VAL?[10][I] 22.004 MEME 22.005 MEMC 300 Z 0.09U #! Test Tol 0.09, Sys Tol 5e-005, TUR 1800.000 (>= 4.00). 23.001 5700 190.00Z S 4W 23.002 PORT [CLR]MON_VAL?[10][I] 23.003 MEME 23.004 MEMC 300 Z -0.13U +0.20U #! Test Tol 0.13, Sys Tol 0.00323, TUR 40.248 (>= 4.00). 24.001 PORT MON 0;FUNC 1,OHMS,2,4;MON 1,1[10] 24.002 5700 0.0000kZ S 4W 24.003 PORT [CLR]MON_VAL?[10][I] 24.004 MATH MEM = MEM / 1000 24.005 MEME 24.006 MEMC 3 kZ 0.0003U #! Test Tol 0.3, Sys Tol 5e-005, TUR 6000.000 (>= 4.00). 25.001 5700 1.9000kZ S 4W 25.002 PORT [CLR]MON_VAL?[10][I] 25.003 MATH MEM = MEM / 1000 25.004 MEME 25.005 TOL -.0013U +.0014U 25.006 MEMC 3 kZ TOL #! Test Tol 1.3, Sys Tol 0.0228, TUR 57.018 (>= 4.00). 26.001 PORT MON 0;FUNC 1,OHMS,3,4;MON 1,1[10] 26.002 5700 19.000kZ S 4W 26.003 PORT [CLR]MON_VAL?[10][I] 26.004 MATH MEM = MEM / 1000 26.005 MEME 26.006 MEMC 30 kZ 0.013U #! Test Tol 13, Sys Tol 0.209, TUR 62.201 (>= 4.00). 27.001 PORT MON 0;FUNC 1,OHMS,4,4;MON 1,1[10] 27.002 5700 190.00kZ S 4W 27.003 PORT [CLR]MON_VAL?[10][I] 27.004 MATH MEM = MEM / 1000 27.005 MEME 27.006 MEMC 300 kZ 0.13U #! Test Tol 130, Sys Tol 2.47, TUR 52.632 (>= 4.00). 28.001 PORT MON 0;FUNC 1,OHMS,5,4;MON 1,1[10] 28.002 5700 1.9000MZ S 4W 28.003 PORT [CLR]MON_VAL?[10][I] 28.004 MATH MEM = MEM / 1000000 28.005 MEME 28.006 MEMC 3 MZ 0.0014U #! Test Tol 1400, Sys Tol 36.1, TUR 38.781 (>= 4.00). 29.001 PORT MON 0[10] 29.002 5700 * S 29.003 HEAD {} 29.004 HEAD {* FREQUENCY TEST *} 29.005 JMP 30.001 29.006 EVAL 30.001 PORT FUNC 1,FREQ,3;MON 1,1[10] 30.002 5700 10.000kH 2.9V S 2W 30.003 PORT [CLR]MON_VAL?[10][I] 30.004 MATH MEM = MEM / 1000 30.005 MEME 30.006 MEMC 90 kH 0.006U #! Test Tol 6, Sys Tol 1, TUR 6.000 (>= 4.00). 31.001 5700 * S 31.002 PORT MON 0[10] 31.003 HEAD {} 31.004 END #! T.U.R.s less than 4.00: 0 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.